Thermal-aware testing of digital VLSI circuits and systems cover image

Thermal-aware testing of digital VLSI circuits and systems

By Chattopadhyay, Santanu
pdf
Format
2018
Year
English
Language
Unknown
Publisher

Summary

The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable for the researchers working on power- and thermal-aware design and test of digital VLSI chips</div> <br> Abstract: <div class="showMoreLessReadmore"> The book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. The book will be suitable<span class='showMoreLessContentElement' style='display: none;'> for the researchers working on power- and thermal-aware design and test of digital VLSI chips--</span> <span class='showMoreLessControlElement'><span class="control-link">Read more...</span></span>

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